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SN74LVT8980A-EP - EMBEDDED TEST-BUS CONTROLLERS

Description

The SN74LVT8980A embedded test-bus controllers (eTBCs) are members of the TI broad family of testability integrated circuits.

This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit assemblies.

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Full PDF Text Transcription

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SN74LVT8980AĆEP EMBEDDED TESTĆBUS CONTROLLER IEEE STD 1149.1 (JTAG) TAP MASTERS WITH 8ĆBIT GENERIC HOST INTERFACES SCBS761A − JUNE 2003 − REVISED OCTOBER 2003 D Controlled Baseline − One Assembly/Test Site, One Fabrication Site D Enhanced Diminishing Manufacturing Sources (DMS) Support D Enhanced Product-Change Notification D Qualification Pedigree† D Member of Texas Instruments Broad Family of Testability Products Supporting IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture D Provide Built-In Access to IEEE Std 1149.1 Scan-Accessible Test/Maintenance Facilities at Board and System Levels D While Powered at 3.3 V, the TAP Interface Is Fully 5-V Tolerant for Mastering Both 5-V and/or 3.3-V IEEE Std 1149.1 Targets D Simple Interface to Low-Cost 3.
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