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SN74LVT8980A Datasheet EMBEDDED TEST-BUS CONTROLLERS

Manufacturer: Texas Instruments

Overview: SN54LVT8980A, SN74LVT8980A EMBEDDED TESTĆBUS CONTROLLERS IEEE STD 1149.1 (JTAG) TAP MASTERS WITH 8ĆBIT GENERIC HOST INTERFACES SCBS755B − APRIL 2002 − REVISED MARCH 2004 D Members of Texas Instruments Broad Family of Testability Products Supporting IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture D Provide Built-In Access to IEEE Std 1149.1 Scan-Accessible Test/Maintenance Facilities at Board and System Levels D While Powered at 3.3 V, the TAP Interface Is Fully 5-V Tolerant for Mastering Both 5-V and/or 3.3-V IEEE Std 1149.1 Targets D Simple Interface to Low-Cost 3.3-V Microprocessors/Microcontrollers Via 8-Bit Asynchronous Read/Write Data Bus D Easy Programming Via Scan-Level Command Set and Smart TAP Control D Transparently Generate Protocols to Support Multidrop TAP Configurations Using TI’s Addressable Scan Port D Flexible TCK Generator Provides Programmable Division, Gated-TCK, and Free-Running-TCK Modes D Discrete TAP Control Mode Supports Arbitrary TMS/TDI Sequences for Noncompliant Targets D Programmable 32-Bit Test Cycle Counter Allows Virtually Unlimited Scan/Test Length D Accommodate Target Retiming (Pipeline) Delays of up to 15 TCK Cycles D Test Output Enable (TOE) Allows for External Control of TAP Signals D High-Drive Outputs (−32-mA IOH, 64-mA IOL) at TAP Support Backplane Interface and/or High Fanout SN54LVT8980A . . . JT PACKAGE SN74LVT8980A . . . DW PACKAGE (TOP VIEW) STRB 1 R/W 2 D0 3 D1 4 D2 5 D3 6 GND 7 D4 8 D5 9 D6 10 D7 11 CLKIN 12 24 A0 23 A1 22 A2 21 RDY 20 TDO 19 VCC 18 TCK 17 TMS 16 TRST 15 TDI 14 RST 13 TOE SN54LVT8980A . . .

General Description

The ’LVT8980A embedded test-bus controllers (eTBCs) are members of the TI broad family of testability integrated circuits.

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