SN74LVT8980A Datasheet | Texas Instruments

description The ’LVT8980A embedded test-bus controllers (e TBCs) are members of the TI broad family of testability integrated circuits. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of plex circuit assemblies. Unlike most other devices of this family, the e TBCs are not boundary-scannable devices; rather, their function is to master an IEEE Std 1149.1 (JTAG) test access port (TAP) under the mand of an embedded host microprocessor/microcontroller. Thus, the e TBCs enable the practical and effective use of the IEEE Std 1149.1 test-access infrastructure to support embedded/built-in test, emulation, and configuration/maintenance facilities at board and system levels. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. UNLESS OTHERWISE NOTED this document contains PRODUCTION DATA information current as of publication date. Products conform to specifications per the terms of Texas Instruments standard...