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SN74LVTH182504A - 3.3-V ABT SCAN TEST DEVICES

Download the SN74LVTH182504A datasheet PDF (SN74LVTH18504A included). The manufacturer datasheet provides complete specifications, pinout details, electrical characteristics, and typical applications for 3.3-v abt scan test devices.

Description

The ’LVTH18504A and ’LVTH182504A scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family.

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Note: The manufacturer provides a single datasheet file (SN74LVTH18504A-etcTI.pdf) that lists specifications for multiple related part numbers.

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Full PDF Text Transcription

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SN54LVTH18504A, SN54LVTH182504A, SN74LVTH18504A, SN74LVTH182504A 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS667B – JULY 1996 – REVISED JUNE 1997 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus ™ Family D State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) D Support Unregulated Battery Operation Down to 2.
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