| Part | SN74LVTH182504A |
|---|---|
| Description | 3.3-V ABT SCAN TEST DEVICES |
| Manufacturer | Texas Instruments |
| Size | 858.30 KB |
Package: LQFP
Mount Type: Surface Mount
Pins: 64
Operating Voltage: 3.3 V
The ’LVTH18504A and ’LVTH182504A scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.
| Seller | Inventory | Price Breaks | Buy |
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| Rochester Electronics | 13728 | 25+ : 5.18 USD 100+ : 4.92 USD 500+ : 4.66 USD 1000+ : 4.4 USD |
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