Datasheet Details
| Part number | SN74LVTH182502A |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 829.79 KB |
| Description | 3.3-V ABT SCAN TEST DEVICES |
| Datasheet | SN74LVTH182502A SN74LVTH18502A Datasheet (PDF) |
|
|
Overview: SN54LVTH18502A, SN54LVTH182502A, SN74LVTH18502A, SN74LVTH182502A 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SCBS668C − JULY 1996 − REVISED JUNE 2004 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus ™ Family D State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) D Support Unregulated Battery Operation Down to 2.7 V D UBT ™ (Universal Bus Transceiver) bines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode D Bus Hold on Data Inputs Eliminates the Need for External Pullup Resistors D B-Port Outputs of ’LVTH182502A Devices Have Equivalent 25-Ω Series Resistors, So No External Resistors Are Required D patible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D SCOPE ™ Instruction Set − IEEE Standard 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ − Parallel-Signature Analysis at Inputs − Pseudorandom Pattern Generation From Outputs − Sample Inputs/Toggle Outputs − Binary Count From Outputs − Device Identification − Even-Parity Opcodes D Packaged in 64-Pin Plastic Thin Quad Flat (PM) Packages Using 0.
This datasheet includes multiple variants, all published together in a single manufacturer document.
| Part number | SN74LVTH182502A |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 829.79 KB |
| Description | 3.3-V ABT SCAN TEST DEVICES |
| Datasheet | SN74LVTH182502A SN74LVTH18502A Datasheet (PDF) |
|
|
|
The ’LVTH18502A and ’LVTH182502A scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE™ testability integrated-circuit family.
This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of plex circuit-board assemblies.
Scan access to the test circuitry is acplished via the 4-wire test access port (TAP) interface.
| Part Number | Description |
|---|---|
| SN74LVTH182504A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH182512 | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH182646A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH182652A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH18502A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH18504A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH18512 | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH18646A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH18652A | 3.3-V ABT SCAN TEST DEVICES |
| SN74LVTH125 | 3.3-V ABT QUADRUPLE BUS BUFFER |