SN74SSTV32852-EP
FEATURES
- 2 Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
- Extended Temperature Performance of
- 40°C to 85°C
- Enhanced Diminishing Manufacturing Sources (DMS) Support
- Enhanced Product-Change Notification
- Qualification Pedigree (1)
- Member of the Texas Instruments Widebus™ Family
- 1-to-2 Outputs Support Stacked DDR DIMMs
(1) ponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold pound life. Such qualification testing should not be viewed as justifying use of this ponent beyond specified performance and environmental limits.
- Supports SSTL_2 Data Inputs
- Outputs Meet SSTL_2 Class II Specifications
- Differential Clock (CLK and CLK) Inputs
- Supports LVCMOS Switching Levels on the
RESET...
