TL1591 Datasheet | Texas Instruments

TL1591 SAMPLE-AND-HOLD CIRCUIT FOR CCD IMAGERS - 15-MHz Sampling Rate - 30-ns Acquisition Time - Diode-Bridge Switch - 25-MHz Bandwidth - Low-Voltage Supply description SOCS026B - SEPTEMBER 1989 - REVISED JUNE 1994 P OR PS PACKAGE (TOP VIEW) ANLG VCC 1 ANLG IN 2 ANLG GND 3 ANLG OUT 4 8 DGTL VCC 7 DGTL IN 6 DGTL GND 5 SUB GND The TL1591 is a monolithic integrated sample-and-hold circuit that uses the Bi FET process with Schottky-barrier diodes and is designed for use with CCD area imagers. This device consists of an ultra-fast input-buffer amplifier, a digital-controlled diode-bridge switch, and a high-impedance output buffer amplifier. The electronic switch is controlled by an LS-TTL-patible logic input. functional block diagram 4 ANLG OUT 2 ANLG IN A1 A2 A3 DGTL IN C1 This device contains circuits to protect its inputs and outputs against damage due to high static voltages or electrostatic fields. These circuits have been qualified to protect this device against electrostatic discharges (ESD) of up to 2 k V according to MIL-STD-883C, Method 3015; however, precautions should be taken to avoid application of any voltage higher than maximum-rated voltages to these high-impedance circuits. During storage or handling, the device leads should be shorted together or the device should be placed in conductive foam. In a circuit, unused inputs should always be connected to an appropriate logic voltage level, preferably either VCC or ground. Specific guidelines for handling devices of this type are contained in the publication Guidelines for Handling Electrostatic-Discharge-Sensitive (ESDS) Devices and Assemblies available from Texas Instruments. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. - POST OFFICE BOX 655303 DALLAS, TEXAS 75265 Copyright © 1994, Texas Instruments...