• Part: TPS65193
  • Description: Dual High-Voltage Scan Driver
  • Manufacturer: Texas Instruments
  • Size: 2.27 MB
Download TPS65193 Datasheet PDF
Texas Instruments
TPS65193
TPS65193 is Dual High-Voltage Scan Driver manufactured by Texas Instruments.
FEATURES - Dual High-Voltage Scan Driver - Scan Driver Output Charge Share - High Output-Voltage Level: Up to 35 V - Low Output-Voltage Level: Down to - 28 V - Logic-Level Inputs - 24-Pin 4-mm × 4-mm QFN package APPLICATIONS - TFT LCD Using Amorphous Silicon Gate (ASG) Technology DESCRIPTION The TPS65193 is dual high-voltage scan driver to drive an amorphous-silicon-gate (ASG) circuit on TFT glass. Each single high-voltage scan driver receives logic-level inputs of CPVx and generates two high-voltage outputs of CKVx and CKVBx. The device receives a logic-level input of STV and generates a high-voltage output of STVP. These outputs are swings from Voff (- 28 V) to Von (35 V) and are used to drive the ASG circuit and charge/discharge the capacitive loads of the TFT LCD. In order to reduce the power dissipation of the device, a charge-share function is implemented. The device features a discharge function, which shorts Voff to GND in order to shut down the panel faster when the LCD is turned off. CKV1 to ASG RBCS1 RCS1 CKVB1 to ASG STVP to ASG CKVB2 to ASG CKV2 to ASG RBCS2 RCS2 1 CKVB1 2 STVP 3 CKVB2 4 CKVBCS2 5 CKVCS2 6 CKV2 CKVBCS1 24 CKVCS1 23 CKV1 22 AGND 21 NC 20 VON 19 VON CVON VOFF 18 NC 17 NC 16 DISH 15 AGND 14 NC 13 VOFF CVOFF Vlogic CDISH 12 DLY 11 EN 10 NC STV CPV1 CPV2 STV from T-CON 7 CPV1 from T-CON 8 CPV2 from T-CON 9 CDLY S0418-01 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2009- 2010, Texas Instruments...