| Part Number | SCANPSC110F datasheet |
|---|---|
| Manufacturer | National Semiconductor |
| Overview | The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan chain is improved test throughput. not described in this datasheet such as 8 slot inputs for enhanced address capability and additional instructions. For a completed description of the additional instructions supported, refer to the SCANPSC110 supplemental datasheet. Features n True IEEE1149.1 hierarchical and multidrop addressable . |
SCANPSC110F Datasheet PDF
The SCANPSC110F is a SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port.
| Part Number | SCANPSC110F datasheet |
|---|---|
| Description | SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port |
| Manufacturer | Fairchild Semiconductor |
| Overview | The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan chain is improved test throughput. s True IEEE1149.1 hierarchical and multidrop addressable capability s The 6 slot inputs support up to 59 unique addresses, a Broadcast Address, and 4 Multi-cast Group Addresses s 3 IEEE 1149.1-compatible configurable local scan ports s Mode Register allows local TAPs to be bypassed, selected for ins. |