
SN74ABT18652 (Texas Instruments)
SCAN TEST DEVICE
D Member of the Texas Instruments
Widebus Family
D Compatible With IEEE Std 1149.1-1990
(JTAG) Test Access Port and
Boundary-Scan Architecture
D Incl
(12 views)
D Member of the Texas Instruments Widebus Famil.
SCAN TEST DEVICE
SN74ABT18652 Distributor