SN74ABT18652

SCAN TEST DEVICE

Texas Instruments

SN74ABT18652 General Description

This scan test device with an 18-bit bus transceiver and register is a member of the Texas Instruments SCOPE testability IC family. This device supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished vi.

SN74ABT18652 Datasheet (500.35 KB)

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Datasheet Details

Part number:

SN74ABT18652

Manufacturer:

Texas Instruments ↗

File Size:

500.35 KB

Description:

Scan test device.
D Member of the Texas Instruments Widebus Family D Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Incl.

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SN74ABT18652 SCAN TEST DEVICE Texas Instruments

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SN74ABT18652 General Description

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