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SN74ABT18652 Datasheet - Texas Instruments

SN74ABT18652 - SCAN TEST DEVICE

This scan test device with an 18-bit bus transceiver and register is a member of the Texas Instruments SCOPE testability IC family.

This device supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies.

Scan access to the test circuitry is accomplished vi

D Member of the Texas Instruments Widebus Family D Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data D Two Boundary-Scan Cells Per I/O for Greater Flexibility SN74ABT18652 SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER SCBS132B AUGUST 1992 REVISED JANUARY 2002 D SCOPE Instruction Set IEEE Std 1149.1-1

SN74ABT18652-etcTI.pdf

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Datasheet Details

Part number:

SN74ABT18652

Manufacturer:

Texas Instruments ↗

File Size:

500.35 KB

Description:

Scan test device.

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