SN74ABT18640 Datasheet - Texas Instruments

SN74ABT18640 SCAN TEST DEVICE

The ’ABT18640 scan test devices with 18-bit inverting bus transceivers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to .

SN54ABT18640, SN74ABT18640 SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS SCBS267C FEBRUARY 1994 REVISED JULY 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus™ Family D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D SCOPE ™ Instruction Set IEEE Standard 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ Par.

SN74ABT18640 Datasheet (552.32 KB)