SN74ABT18640 - SCAN TEST DEVICE
The ’ABT18640 scan test devices with 18-bit inverting bus transceivers are members of the Texas Instruments SCOPE™ testability integrated-circuit family.
This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.
Scan access to
SN54ABT18640, SN74ABT18640 SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS SCBS267C FEBRUARY 1994 REVISED JULY 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus™ Family D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D SCOPE ™ Instruction Set IEEE Standard 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ Par
