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SN74ABT18502 Datasheet - Texas Instruments

SN74ABT18502 - SCAN TEST DEVICE

The SN74ABT18502 scan test device with an 18-bit universal bus transceiver is a member of the Texas Instruments SCOPE  testability IC family.

This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies.

Scan access to the test circuit

SN74ABT18502 SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER SCBS753 FEBRUARY 2002 D Member of the Texas Instruments Widebus Family D UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode D Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture D Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data D Two Bounda

SN74ABT18502-etcTI.pdf

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Datasheet Details

Part number:

SN74ABT18502

Manufacturer:

Texas Instruments ↗

File Size:

725.78 KB

Description:

Scan test device.

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