SN74ABT18245A - SCAN TEST DEVICES
The ’ABT18245A scan test devices with 18-bit bus transceivers are members of the Texas Instruments SCOPE™ testability integratedcircuit family.
This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.
Scan access to the test c
SN54ABT18245A, SN74ABT18245A SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS SCBS110H AUGUST 1992 REVISED FEBRUARY 1999 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus™ Family D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D SCOPE ™ Instruction Set IEEE Standard 1149.1-1990 Required Instructions, CLAMP and HIGHZ Parallel-Signature An
