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SN74ABT18646

SCAN TEST DEVICE

SN74ABT18646 General Description

This scan test device with a 18-bit bus transceiver and register is a member of the Texas Instruments SCOPE testability IC family. This device supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via.

SN74ABT18646 Datasheet (499.52 KB)

Preview of SN74ABT18646 PDF

Datasheet Details

Part number:

SN74ABT18646

Manufacturer:

Texas Instruments ↗

File Size:

499.52 KB

Description:

Scan test device.
D Member of the Texas Instruments Widebus Family D Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Incl.

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TAGS

SN74ABT18646 SCAN TEST DEVICE Texas Instruments

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