SN74ABT18646 Datasheet - Texas Instruments

SN74ABT18646 SCAN TEST DEVICE

This scan test device with a 18-bit bus transceiver and register is a member of the Texas Instruments SCOPE testability IC family. This device supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via.

D Member of the Texas Instruments Widebus Family D Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data D Two Boundary-Scan Cells Per I/O for Greater Flexibility SN74ABT18646 SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER SCBS131A AUGUST 1992 REVISED JANUARY 2002 D SCOPE Instruction Set IEEE Std 1149.1-1.

SN74ABT18646 Datasheet (499.52 KB)