Datasheet Specifications
- Part number
- SN74ABT18646
- Manufacturer
- Texas Instruments ↗
- File Size
- 499.52 KB
- Datasheet
- SN74ABT18646-etcTI.pdf
- Description
- SCAN TEST DEVICE
Description
D Member of the Texas Instruments Widebus Family D Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Incl.
Applications
* of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE and Widebus are trademarks of Texas Instruments. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments stanSN74ABT18646 Distributors
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