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E2V

CCD201-20 Datasheet Preview

CCD201-20 Datasheet

Electron Multiplying CCD Sensor

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CCD201-20 Back Illuminated 2-Phase IMO Series
Electron Multiplying CCD Sensor
INTRODUCTION
The CCD201 is a large format sensor (41k2) in the L3VisionTM
range of products from e2v technologies. This device uses a
novel output amplifier circuit that is capable of operating at an
equivalent output noise of less than one electron at pixel rates
of over 15 MHz. This makes the sensor well suited for scientific
imaging where the illumination is limited.
The sensor is a frame transfer device and can operate in
inverted mode to suppress dark current as this is now the
dominant noise source (even at high readout rate). The image
and store sections are designed to operate in 2-phase mode, to
maximise the highest achievable parallel transfer frequency.
The sensor functions by converting photons to charge in the
image area during the integration time period, then transferring
this charge through the image and store sections into the
readout register. Following transfer through the readout
register, the charge is multiplied in the gain register before
conversion to a voltage by an output amplifier.
The sensor has two output amplifiers; a low noise, high
responsivity output for normal CCD operation and a large
signal amplifier for when multiplication gain is employed.
Operation of the high gain mode is controlled by adjustment of
the multiplication phase amplitude R12HV.
GENERAL DATA
Active image area . . . . . . . . . 13.3 x 13.3 mm
Image section active pixels . . . . . 1024 (H) x 1024 (V)
Image pixel size . . . . . . . . . . . . 13 x 13 mm
Number of output amplifiers . . . . . . . . . . 2
Fill factor . . . . . . . . . . . . . . . 100%
Additional dark reference columns . . . . . . . 32
Additional overscan rows . . . . . . . . . . . 8
PACKAGE DETAILS (see Fig. 15)
Ceramic Package
Overall dimensions . . . . . . . . . 37.4 x 26.5 mm
Number of pins . . . . . . . . . . . . . . 36
Inter-pin spacing . . . . . . . . . . . 2.54 mm
Mounting position . . . . . . . . . . . . . any
The pin 1 marker is shown in Fig. 15.
STORAGE AND OPERATION
TEMPERATURE EXTREMES
Storage temperature (8C)
Operating temperature (8C)
Temperature ramping (8C/min)
MIN
7200
7120
MAX
+100
+75
5
Note: Operation or storage in humid conditions may give rise
to moisture on the sensor surface on cooling, causing
irreversible damage.
www.DataSheet4U.com
e2v technologies (uk) limited, Waterhouse Lane, Chelmsford, Essex CM1 2QU, UK Telephone: +44 (0)1245 493493 Facsimile: +44 (0)1245 492492
e-mail: enquiries@e2v.com Internet: www.e2v.com Holding Company: e2v technologies plc
e2v technologies inc. 4 Westchester Plaza, PO Box 1482, Elmsford, NY10523-1482 USA Telephone: (914) 592-6050 Facsimile: (914) 592-5148
e-mail: enquiries@e2vtechnologies.us
# e2v technologies (uk) limited 2005
A1A-100013 Issue 1, June 2005
411/9140




E2V

CCD201-20 Datasheet Preview

CCD201-20 Datasheet

Electron Multiplying CCD Sensor

No Preview Available !

TYPICAL PERFORMANCE SPECIFICATIONS
Except where otherwise specified, the following are measured for operation at a pixel rate of 15 MHz, with typical operating voltages.
Parameters are given at 223 K unless specified otherwise. Where parameters are different in the normal and high gain mode, both are
given.
PARAMETER
Output amplifier responsivity, HR amplifier (normal mode) (see note 1)
Output amplifier responsivity, LS amplifier (normal mode) (see note 1)
Multiplication register gain, LS amplifier (high gain mode)
(see notes 2, 3 and 4)
Peak signal - 2-phase IMO
Charge handling capacity of multiplication register (see note 5)
Charge handling capacity of HR amplifier (see note 6)
Charge handling capacity of LS amplifier (see note 6)
Readout noise at 50 kHz with CDS, HR amplifier (normal mode)
(see note 6)
Readout noise at 1 MHz with CDS, HR amplifier (normal mode)
(see note 6)
Amplifier reset noise (without CDS), HR amplifier (normal mode)
(see note 6)
Readout noise at 15 MHz with CDS, LS amplifier (normal mode)
(see note 6)
Amplifier reset noise (without CDS), LS amplifier (normal mode)
(see note 6)
Readout noise at 1 MHz (high gain mode) (see note 6)
Maximum frequency (settling to 1%), HR amplifier (see notes 6 and 7)
Maximum frequency (settling to 5%), HR amplifier (see notes 6 and 7)
Maximum frequency (settling to 1%), LS amplifier (see note 6 and 7)
Maximum frequency (settling to 5%), LS amplifier (see note 6 and 7)
Maximum parallel transfer frequency (see note 1)
Dark signal at 293 K (see note 8)
Dark signal non-uniformity (DSNU) at 293 K (see note 9)
Excess noise factor (see note 10)
UNIT
mV/e7
mV/e7
e7/pixel
e7/pixel
e7
e7
e7 rms
e7 rms
e7 rms
e7 rms
e7 rms
e7 rms
MHz
MHz
MHz
MHz
MHz
e7/pixel/s
e7/pixel/s
MIN
1
50k
TYPICAL
5.3
1.4
80k
730k
280k
1M
3.1
6.0
50
43
100
51
0.9
260
90
H2
MAX
1000
3
4.5
13
20
530
wwwN.DOataTSEhSeet4U.com
1. Measured at a pixel rate of 1 MHz.
2. The typical variation of gain with R12HV is shown in Fig. 1.
3. The variation of gain with R12HV at different temperatures is shown in Fig. 1.
4. Some increase of R12HV may be required throughout life to maintain gain performance. Adjustment of R12HV should be
limited to the maximum specified under Operating Conditions.
5. When multiplication gain is used and clock timings optimised, a linear response of output signal with input signal of better than
3% is achieved for output signals up to 400 ke7 typically.
6. These values are inferred by design and not measured.
7. The quoted maximum frequencies assume a 20 pF load and that correlated double sampling is being implemented.
8. The quoted dark signal has the usual temperature dependence for inverted mode operation. For operation at high frame rates
with short integration times, there will also be a component generated during readout through the register. Operating at a
temperature of 293 K and 10 Hz frame rate, the readout component contributes 5.8 e7/pixel/frame typically, at a gain of 1000
and referenced to the image area, and has a temperature dependence consistent with non-inverted mode operation.
There exists a further weakly temperature dependent component, the clock induced charge, which is independent of the
integration time. The clock induced charge is dependent on the operating biases and timings employed and is typically 0.2 e7/
pixel/frame at T = 755 8C.
For more information, refer to the technical note "Dark Signal and Clock-Induced Charge in L3VisionTM CCD Sensors".
9. DSNU is defined as the 1s variation of the dark signal.
10. The excess noise factor is defined as the factor by which the multiplication process increases the shot noise on the image when
multiplication gain is used.
100013, page 2
# e2v technologies


Part Number CCD201-20
Description Electron Multiplying CCD Sensor
Maker E2V
Total Page 15 Pages
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