HCTS157MS Datasheet | Intersil

Features - 3 Micron Radiation Hardened CMOS SOS - Total Dose 200K RAD (Si) - SEP Effective LET No Upsets: >100 MEV-cm2/mg - Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/ Bit-Day (Typ) - Dose Rate Survivability: >1 x 1012 RAD (Si)/s - Dose Rate Upset >1010 RAD (Si)/s 20ns Pulse - Latch-Up Free Under Any Conditions - Fanout (Over Temperature Range) - Standard Outputs 10 LSTTL Loads - Military Temperature Range: -55o C to +125o C 2I1 6 2Y 7 GND 8 - Significant Power Reduction pared to LSTTL ICs - DC Operating Voltage Range: 4.5V to 5.5V - LSTTL Input patibility - VIL = 0.8V Max - VIH = VCC/2 Min - Input Current Levels Ii ≤ 5µA at VOL, VOH S 1I0 1I1 1Y 2I0 2I1 2Y GND 16 LEAD CERAMIC METAL SEAL FLATPACK PACKAGE (FLATPACK) MIL-STD-1835 CDFP4-F16 TOP VIEW 1 2 3 4 5 6 7 8 16 15 14 13 12 11 10 9 VCC E 4I0 4I1 4Y 3I0 3I1 3Y Description The Intersil HCTS157MS is a Radiation Hardened quad 2-input multiplexers with select and enable inputs. The HCTS157MS utilizes advanced CMOS/SOS technology to achieve high-speed operation. This device is a member of radiation hardened, high-speed, CMOS/SOS Logic Family. The HCTS157MS is supplied in a 16 lead Ceramic flatpack (K suffix) or a SBDIP Package (D suffix). Ordering Information PART NUMBER HCTS157DMSR HCTS157KMSR HCTS157D/Sample HCTS157K/Sample HCTS157HMSR TEMPERATURE RANGE -55o C to +125o C -55o C to +125o C +25o C +25o C +25o C SCREENING LEVEL Intersil Class S Equivalent Intersil Class S Equivalent Sample Sample Die PACKAGE 16 Lead SBDIP 16 Lead Ceramic Flatpack 16 Lead SBDIP 16 Lead Ceramic Flatpack Die DB NA CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. http://.intersil. or 407-727-9207 | Copyright © Intersil Corporation 1999 Spec Number File Number 518610 2464.2 HCTS157MS Functional Block Diagram S 1 4I1 13 12 14 10 11 6 5 3 2 3 CIRCUITS IDENTICAL TO CIRCUIT IN ABOVE DASHED OUTLINE 7 4 2Y 1Y 9 3Y 4Y 4I0 3I1 3I0 2I1 2I0 1I1 1I0 TRUTH TABLE SELECT INPUTS S...