* 3 Micron Radiation Hardened SOS CMOS
* Total Dose 200K RAD (Si)
* SEP Effective LET No Upsets: >100 MEV-cm2/mg
* Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/Bit-Day (Typ)
* Dose Rate Survivability: >1 x
* Dose Rate Upset >10 10 1012 RAD (Si
HCTS10MS Datasheet (147.99 KB)
HCTS10MS
Intersil Corporation
147.99 KB
Radiation hardened triple 3-input nand gate.
HCTS10MS September 1995 Radiation Hardened Triple 3-Input NAND Gate Pinouts 14 LEAD CERAMIC DUAL-IN-LINE METAL SEAL PACKAGE (SBDIP) MIL-STD-1835 CDIP.
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