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SCANPSC110F Datasheet SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port

Manufacturer: National Semiconductor (now Texas Instruments)

Download the SCANPSC110F datasheet PDF. This datasheet also includes the SCANPSC110 variant, as both parts are published together in a single manufacturer document.

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Note: The manufacturer provides a single datasheet file (SCANPSC110_NationalSemiconductor.pdf) that lists specifications for multiple related part numbers.

General Description

The SCANPSC110F Bridge extends the IEEE Std.

1149.1 test bus into a multidrop test bus environment.

The advantage of a hierarchical approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modules.

Overview

SCANPSC110F SCAN Bridge October 1999 SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.

Key Features

  • not described in this datasheet such as 8 slot inputs for enhanced address capability and additional instructions. For a completed.