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OBSOLETE
SCANPSC100F
www.ti.com
SNOS134D – SEPTEMBER 1998 – REVISED APRIL 2013
SCANPSC100F Embedded Boundary Scan Controller (IEEE 1149.1 Support)
Check for Samples: SCANPSC100F
FEATURES
1
•23 Compatible with IEEE Std. 1149.1 (JTAG) Test Access Port and Boundary Scan Architecture
• Supported by Texas Instruments SCAN Ease (Embedded Application Software Enabler) Software
• Uses Generic, Asynchronous Processor Interface; Compatible with a Wide Range of Processors and PCLK Frequencies
• Directly Supports Up to Two 1149.1 Scan Chains
• 16-bit Serial Signature Compaction (SSC) at the Test Data In (TDI) Port
• Automatically Produces Pseudo-Random Patterns at the Test Data Out (TDO) Port
• Fabricated on FACT™ 1.5 μm CMOS Process
• Supports 1149.
SCANPSC100F Datasheet
