Datasheet Summary
- Member of the Texas Instruments SCOPE ™
Family of Testability Products
- Member of the Texas Instruments
Widebus ™ Family
- patible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
- UBT ™ (Universal Bus Transceiver) bines D-Type Latches and D-Type
Flip-Flops for Operation in Transparent,
Latched, or Clocked Mode
- Two Boundary-Scan Cells per I/O for
Greater Flexibility
- State-of-the-Art EPIC-ΙΙB ™ BiCMOS Design
Significantly Reduces Power Dissipation
SN54ABT18502 SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER
SCBS109C
- AUGUST 1992
- REVISED AUGUST 1994
- SCOPE ™ Instruction Set
- IEEE Standard 1149.1-1990 Required Instructions,...