SN54ABT18640 Datasheet | Texas Instruments

SN54ABT18640, SN74ABT18640 SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS SCBS267C - FEBRUARY 1994 - REVISED JULY 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus™ Family D patible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D SCOPE ™ Instruction Set - IEEE Standard 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ - Parallel-Signature Analysis at Inputs - Pseudo-Random Pattern Generation From Outputs - Sample Inputs/Toggle Outputs - Binary Count From Outputs - Device Identification - Even-Parity Opcodes D State-of-the-Art EPIC-ΙΙB™ BiCMOS...