Scan Tester
| Part number | SN54BCT8374A |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 501.91 KB |
| Description | SCAN TESTER |
| Datasheet | SN54BCT8374A-etcTI.pdf |
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The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of plex circuit-board assemblies. Scan access to the test circuitry is acplished via the 4-wire test access port (TAP) interface.
See all Texas Instruments datasheets
| Part Number | Description |
|---|---|
| SN54BCT8373A | SCAN TESTER |
| SN54BCT8240A | SCAN TESTER |
| SN54BCT8244A | SCAN TESTER |
| SN54BCT8245A | SCAN TESTER |
| SN54BCT125A | QUADRUPLE BUS BUFFER GATES |
| SN54BCT126A | QUADRUPLE BUS BUFFER GATES |
| SN54BCT2240 | OCTAL BUFFERS AND LINE/MOS DRIVERS |
| SN54BCT2244 | OCTAL BUFFERS AND LINE/MOS DRIVERS |
| SN54BCT240 | OCTAL BUFFERS/DRIVERS |
| SN54BCT244 | Octal Buffers/Drivers |
