SN54BCT8374A - SCAN TESTER

Texas Instruments

General Description

The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability integrated-circuit family.

This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.

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SN54BCT8374A scan tester by Texas Instruments - Datasheet Preview

Datasheet Details

Part number	SN54BCT8374A
Manufacturer	Texas Instruments
File Size	501.91 KB
Description	SCAN TESTER
Datasheet	SN54BCT8374A Datasheet

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Full PDF Text Transcription (Reference)

The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.

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SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SCOPE  Family of Testability Products D Octal Test-Integrated Circuits D Functionally Equivalent to ’F374 and ’BCT374 in the Normal-Function Mode D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Test Operation Synchronous to Test Access Port (TAP) D Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage (10 V ) on TMS Pin D SCOPE  Instruction Set − IEEE Standard 1149.