SN74BCT8374A - SCAN TESTER
The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan acces
SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E * JUNE 1990 * REVISED JULY 1996 D Members of the Texas Instruments SCOPE Family of Testability Products D Octal Test-Integrated Circuits D Functionally Equivalent to ’F374 and ’BCT374 in the Normal-Function Mode D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Test Operation Synchronous to Test Access Port (TAP) D Implement O
File Size:
501.91 KB
Description:
Scan tester.
