SN74BCT8373A Description
The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE™ testability integratedcircuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of plex circuit board assemblies. Scan access to the test circuitry is acplished via the 4-wire test access port (TAP) interface.