| Part | SN74BCT8373A |
|---|---|
| Description | SCAN TESTER |
| Manufacturer | Texas Instruments |
| Size | 488.69 KB |
Package: SOIC
Mount Type: Surface Mount
Pins: 24
Max Voltage (typical range): 5.5 V
The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE™ testability integratedcircuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies.
| Seller | Inventory | Price Breaks | Buy |
|---|---|---|---|
| Arrow Electronics | 50 | 25+ : 7.26 USD | View Offer |
| Rochester Electronics | 2976 | 25+ : 8.23 USD 100+ : 7.82 USD 500+ : 7.41 USD 1000+ : 7 USD |
View Offer |
| Part Number | Manufacturer | Description |
|---|---|---|
| DS2172 | Dallas Semiconducotr | Bit Error Rate Tester BERT |
| DS21372 | Dallas Semiconducotr | 3.3V Bit Error Rate Tester BERT |
| METRAtest-36ASi | GOSSEN METRAWATT | AS Interface System Tester |