SN74BCT8373A Datasheet | Texas Instruments

description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE™ testability integratedcircuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of plex circuit board assemblies. Scan access to the test circuitry is acplished via the 4-wire test access port (TAP) interface. SN54BCT8373A . . . JT PACKAGE SN74BCT8373A . . . DW OR NT PACKAGE (TOP VIEW) LE 1 1Q 2 2Q 3 3Q 4 4Q 5 GND 6 5Q 7 6Q 8 7Q 9 8Q 10 TDO 11 TMS 12 24 OE 23 1D 22 2D 21 3D 20 4D 19 5D 18 VCC 17 6D 16 7D 15 8D 14 TDI 13 TCK SN54BCT8373A . . . FK PACKAGE (TOP VIEW) 7D 6D 5D 4D 3D 4 3 2 1 28 27 26 2D 5 25 8D 1D 6 24 TDI OE 7 23 TCK NC 8 22 NC LE 9 21 TMS 1Q 10 20 TDO 2Q 11 19 8Q 12 13 14 15 16 17 18 7Q 6Q 5Q 4Q 3Q - No internal connection In the normal mode, these devices are functionally equivalent to the ’F373 and ’BCT373 octal D-type latches. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPE™ octal...