Datasheet Details
| Part number | SN74BCT8374A |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 501.91 KB |
| Description | SCAN TESTER |
| Datasheet | SN74BCT8374A-etcTI.pdf |
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Overview: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SCOPE Family of Testability Products D Octal Test-Integrated Circuits D Functionally Equivalent to ’F374 and ’BCT374 in the Normal-Function Mode D patible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Test Operation Synchronous to Test Access Port (TAP) D Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage (10 V ) on TMS Pin D SCOPE Instruction Set − IEEE Standard 1149.
| Part number | SN74BCT8374A |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 501.91 KB |
| Description | SCAN TESTER |
| Datasheet | SN74BCT8374A-etcTI.pdf |
|
|
|
The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability integrated-circuit family.
This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of plex circuit-board assemblies.
Scan access to the test circuitry is acplished via the 4-wire test access port (TAP) interface.
| Part Number | Description |
|---|---|
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| SN74BCT8244A | SCAN TESTER |
| SN74BCT8245A | SCAN TESTER |
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| SN74BCT2244 | OCTAL BUFFERS AND LINE/MOS DRIVERS |