SN74BCT8374A Overview
Key Specifications
Package: SOIC
Mount Type: Surface Mount
Pins: 24
Max Voltage (typical range): 5.5 V
Description
The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.