Datasheet Details
| Part number | SN74BCT8374A |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 501.91 KB |
| Description | SCAN TESTER |
| Datasheet |
 SN74BCT8374A Datasheet
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| Part number | SN74BCT8374A |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 501.91 KB |
| Description | SCAN TESTER |
| Datasheet |
SN74BCT8374A Datasheet
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The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability integrated-circuit family.
This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.