SN74BCT8374A Datasheet | Texas Instruments

description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of plex circuit-board assemblies. Scan access to the test circuitry is acplished via the 4-wire test access port (TAP) interface. SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE (TOP VIEW) CLK 1 1Q 2 2Q 3 3Q 4 4Q 5 GND 6 5Q 7 6Q 8 7Q 9 8Q 10 TDO 11 TMS 12 24 OE 23 1D 22 2D 21 3D 20 4D 19 5D 18 VCC 17 6D 16 7D 15 8D 14 TDI 13 TCK SN54BCT8374A . . . FK PACKAGE (TOP VIEW) 7D 6D 5D 4D 3D 2D 1D OE NC CLK 1Q 2Q 4 3 2 1 28 27 26 12 13 14 15 16 17 18 8D TDI TCK NC TMS TDO 8Q 7Q 6Q 5Q 4Q...