SN74LVC1G17-EP
FEATURES
- Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
- Extended Temperature Performance of
- 55°C to 125°C
- Enhanced Diminishing Manufacturing Sources (DMS) Support
- Qualification Pedigree(1)
- Supports 5-V VCC Operation
- Max tpd of 4.6 ns at 3.3 V
- Low Power Consumption, 10 μA Max ICC
- ±24 m A Output Drive at 3.3 V
- Ioff Supports Partial Power Down Mode
Operation
- Latch-Up Performance Exceeds 100 m A Per JESD 78, Class II
- ESD Protection Exceeds JESD 22
- 2000-V Human-Body Model (A114-A)
- 200-V Machine Model (A115-A)
- 1000-V Charged-Device Model (C101)
(1) ponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold pound life. Such qualification testing should not be viewed as justifying...
