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IRHF7310SE N-CHANNEL TRANSISTOR

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Description

Provisional Data Sheet No.PD-9.1444A REPETITIVE AVALANCHE AND dv/dt RATED IRHF7310SE HEXFET® TRANSISTOR N-CHANNEL SINGLE EVENT EFFECT (SEE) RAD .

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Features

* s Radiation Hardened up to 1 x 105 Rads (Si) s Single Event Burnout (SEB) Hardened s Single Event Gate Rupture (SEGR) Hardened s Gamma Dot (Flash X-Ray) Hardened s Neutron Tolerant s Identical Pre- and Post-Electrical Test Conditions s Repetitive Avalanche Rating s Dynamic dv/dt Rating s Simple Dri

IRHF7310SE Distributors

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