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SN54ABT18245

SCAN TEST DEVICE

SN54ABT18245 General Description

The SN54ABT18245 scan test device with 18-bit bus transceivers is a member of the Texas Instruments SCOPE™ testability integrated circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test.

SN54ABT18245 Datasheet (410.47 KB)

Preview of SN54ABT18245 PDF

Datasheet Details

Part number:

SN54ABT18245

Manufacturer:

Texas Instruments ↗

File Size:

410.47 KB

Description:

Scan test device.
SN54ABT18245 SCAN TEST DEVICE WITH 18-BIT BUS TRANSCEIVERS SGBS307A AUGUST 1994 REVISED JANUARY 1995 Member of the Tex.

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TAGS

SN54ABT18245 SCAN TEST DEVICE Texas Instruments

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