SN54ABT18502 Datasheet (Texas Instruments)

SN54ABT18502, SCAN TEST DEVICE

The SN54ABT18502 scan test device with 18-bit universal bus transceiver is a member of the Texas Instruments SCOPE™ testability integrated circuit family.

This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.

Scan access t

Member of the Texas Instruments SCOPE ™ Family of Testability Products Member of the Texas Instruments Widebus ™ Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT ™ (Universal Bus Transceiver) Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Two Boundary-Scan Cells per I/O for Greater Flexibility State-of-the-Art EPIC-ΙΙB ™