SN54ABT18504 Datasheet - Texas Instruments

SN54ABT18504 SCAN TEST DEVICE

The SN54ABT18504 and SN74ABT18504 scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments SCOPE ™ testability IC family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan acces.

Members of the Texas Instruments SCOPE ™ Family of Testability Products Members of the Texas Instruments Widebus ™ Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT ™ (Universal Bus Transceiver) Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Two Boundary-Scan Cells per I/O for Greater Flexibility State-of-the-Art EPIC-ΙΙB .

SN54ABT18504 Datasheet (778.48 KB)