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SN54BCT8240A

SCAN TESTER

SN54BCT8240A General Description

The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry i.

SN54BCT8240A Datasheet (488.19 KB)

Preview of SN54BCT8240A PDF

Datasheet Details

Part number:

SN54BCT8240A

Manufacturer:

Texas Instruments ↗

File Size:

488.19 KB

Description:

Scan tester.
SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E FEBRUARY 1990 REVISED DECEMBER 1996 D Members .

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TAGS

SN54BCT8240A SCAN TESTER Texas Instruments

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