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SN54BCT8373A

SCAN TESTER

SN54BCT8373A General Description

The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE™ testability integratedcircuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circu.

SN54BCT8373A Datasheet (488.69 KB)

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Datasheet Details

Part number:

SN54BCT8373A

Manufacturer:

Texas Instruments ↗

File Size:

488.69 KB

Description:

Scan tester.
SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F JUNE 1990 REVISED JULY 1996 D Members of the Texa.

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TAGS

SN54BCT8373A SCAN TESTER Texas Instruments

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