SN54BCT8374A
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Scan tester. The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability i
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SN54BCT8373A - SCAN TESTER
(Texas Instruments)
SN54BCT8373A, SN74BCT8373A
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
SCBS044F – JUNE 1990 – REVISED JULY 1996
D Members of the Texas Instruments
SC.
SN54BCT8240A - SCAN TESTER
(Texas Instruments)
SN54BCT8240A, SN74BCT8240A
SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS
SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996
D Members of the Texas Ins.
SN54BCT8244A - SCAN TESTER
(Texas Instruments)
SN54BCT8244A, SN74BCT8244A
SCAN TEST DEVICES
WITH OCTAL BUFFERS
SCBS042E − FEBRUARY 1990 − REVISED JULY 1996
D Members of the Texas Instruments
SCOPE.
SN54BCT8245A - SCAN TESTER
(Texas Instruments)
SN54BCT8245A, SN74BCT8245A
SCAN TEST DEVICES
WITH OCTAL BUS TRANSCEIVERS
SCBS043E − MAY 1990 − REVISED JULY 1996
D Members of the Texas Instruments
S.
SN54BCT125A - QUADRUPLE BUS BUFFER GATES
(Texas Instruments)
D Operating Voltage Range of 4.5 V to 5.5 V D State-of-the-Art BiCMOS Design
Significantly Reduces ICCZ
SN54BCT125A . . . J OR W PACKAGE SN74BCT125A ..
SN54BCT126A - QUADRUPLE BUS BUFFER GATES
(Texas Instruments)
• State-of-the-Art BiCMOS Design
Significantly Reduces ICCZ
• ESD Protection Exceeds 2000 V Per
MIL-STD-883C, Method 3015
• 3-State Outputs Drive Bus .
SN54BCT2240 - OCTAL BUFFERS AND LINE/MOS DRIVERS
(Texas Instruments)
SN54BCT2240, SN74BCT2240
OCTAL BUFFERS AND LINE/MOS DRIVERS
WITH 3-STATE OUTPUTS
SCBS030E − SEPTEMBER 1988 − REVISED MARCH 2003
D Operating Voltage R.
SN54BCT2244 - OCTAL BUFFERS AND LINE/MOS DRIVERS
(Texas Instruments)
D Operating Voltage Range of 4.5 V to 5.5 V D State-of-the-Art BiCMOS Design
Significantly Reduces ICCZ
D Output Ports Have Equivalent 33-Ω Series
Res.
SN54BCT240 - OCTAL BUFFERS/DRIVERS
(Texas Instruments)
D Operating Voltage Range of 4.5 V to 5.5 V D State-of-the-Art BiCMOS Design
Significantly Reduces ICCZ
SN54BCT240 . . . J OR W PACKAGE SN74BCT240 . .
SN54BCT244 - Octal Buffers/Drivers
(Texas Instruments)
• State-of-the-Art BiCMOS Design
Significantly Reduces ICCZ
• P-N-P Inputs Reduce DC Loading • ESD Protection Exceeds 2000 V
Per MIL-STD-883C, Method .