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SN54LVTH182512

3.3-V ABT SCAN TEST DEVICES

SN54LVTH182512 General Description

The ’LVTH18512 and ’LVTH182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Sc.

SN54LVTH182512 Datasheet (683.44 KB)

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Datasheet Details

Part number:

SN54LVTH182512

Manufacturer:

Texas Instruments ↗

File Size:

683.44 KB

Description:

3.3-v abt scan test devices.
SN54LVTH18512, SN54LVTH182512, SN74LVTH18512, SN74LVTH182512 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SCBS671B AUG.

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SN54LVTH182512 3.3-V ABT SCAN TEST DEVICES Texas Instruments

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