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SN54LVTH182652A, SN54LVTH18652A Datasheet - Texas Instruments

SN54LVTH182652A 3.3-V ABT SCAN TEST DEVICES

The ’LVTH18652A and ’LVTH182652A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assem.
SN54LVTH18652A, SN54LVTH182652A, SN74LVTH18652A, SN74LVTH182652A 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS312C MARCH 1994 REVISED JUNE 1997 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus ™ Family D State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) D Support Unregulated Battery Operation Down to 2.7 V D Include.

SN54LVTH18652A-etcTI.pdf

This datasheet PDF includes multiple part numbers: SN54LVTH182652A, SN54LVTH18652A. Please refer to the document for exact specifications by model.
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Datasheet Details

Part number:

SN54LVTH182652A, SN54LVTH18652A

Manufacturer:

Texas Instruments ↗

File Size:

888.40 KB

Description:

3.3-v abt scan test devices.

Note:

This datasheet PDF includes multiple part numbers: SN54LVTH182652A, SN54LVTH18652A.
Please refer to the document for exact specifications by model.

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SN54LVTH182652A SN54LVTH18652A 3.3-V ABT SCAN TEST DEVICES Texas Instruments

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