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SN54LVTH18512 3.3-V ABT SCAN TEST DEVICES

SN54LVTH18512 Description

SN54LVTH18512, SN54LVTH182512, SN74LVTH18512, SN74LVTH182512 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SCBS671B * AUG.
The ’LVTH18512 and ’LVTH182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE ™ testability integ.

SN54LVTH18512 Applications

* of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE, Widebus, and UBT are trademarks of Texas Instruments Incorporated. UNLESS OTHERWISE NOTED this document contains PRODUCTION DATA information current as of publication date. Products con

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3.3-V ABT SCAN TEST DEVICES Texas Instruments
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