SN74ABT8543 Datasheet (Texas Instruments)

SN74ABT8543, SCAN TEST DEVICES

The ’ABT8543 scan test devices with octal registered bus transceivers are members of the Texas Instruments SCOPE™ testability integrated-circuit family.

This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.

Scan access to t

SN54ABT8543, SN74ABT8543 SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS SCBS120E AUGUST 1991 REVISED JULY 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Functionally Equivalent to ’F543 and ’ABT543 in the Normal-Function Mode D SCOPE ™ Instruction Set IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAM