SN74ABT861 Datasheet (320.36 KB)
SN74ABT861
320.36 KB
10-bit transceivers.
D State-of-the-Art EPIC-ΙΙB™ BiCMOS Design
Significantly Reduces Power Dissipation
D ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Excee.
📁 Related Datasheet
SN74ABT863 - 9-BIT BUS TRANSCEIVERS
(Texas Instruments)
D State-of-the-Art EPIC-ΙΙB™ BiCMOS Design
Significantly Reduces Power Dissipation
D Typical VOLP (Output Ground Bounce) < 1 V
at VCC = 5 V, TA = 25°C.
SN74ABT8646 - SCAN TEST DEVICES
(Texas Instruments)
SN54ABT8646, SN74ABT8646 SCAN TEST DEVICES WITH
OCTAL BUS TRANSCEIVERS AND REGISTERS SCBS123F − AUGUST 1992 − REVISED APRIL 2004
D Members of the Tex.
SN74ABT8652 - SCAN TEST DEVICES
(Texas Instruments)
SN54ABT8652, SN74ABT8652
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS
SCBS122F – AUGUST 1992 – REVISED DECEMBER 1996
D Members of the .
SN74ABT821A - 10-BIT BUS-INTERFACE FLIP-FLOPS
(Texas Instruments)
D State-of-the-Art EPIC-ΙΙB™ BiCMOS Design
Significantly Reduces Power Dissipation
D ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015
D Latc.
SN74ABT823 - 9-BIT BUS-INTERFACE FLIP-FLOPS
(Texas Instruments)
SN54ABT823, SN74ABT823
9-BIT BUS-INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS
SCBS158E – JANUARY 1991 – REVISED MAY 1997
D State-of-the-Art EPIC-ΙΙB™ Bi.
SN74ABT8245 - SCAN TEST DEVICES
(Texas Instruments)
SN54ABT8245, SN74ABT8245
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SCBS124D – AUGUST 1992 – REVISED DECEMBER 1996
D Members of the Texas Instrume.
SN74ABT827 - 10-Bit Buffer/Drivers
(Texas Instruments)
SN54ABT827, SN74ABT827 10ĆBIT BUFFERS/DRIVERS
WITH 3ĆSTATE OUTPUTS
SCBS159E − JANUARY 1991 − REVISED APRIL 2005
D State-of-the-Art EPIC-ΙΙB BiCMOS D.
SN74ABT833 - 8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS
(Texas Instruments)
D State-of-the-Art EPIC-ΙΙB™ BiCMOS Design
Significantly Reduces Power Dissipation
D ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Excee.
