SN74ABT8652 - SCAN TEST DEVICES
The ’ABT8652 scan test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPE™ testability integrated-circuit family.
This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.
Scan access t
SN54ABT8652, SN74ABT8652 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS SCBS122F AUGUST 1992 REVISED DECEMBER 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Functionally Equivalent to ’F652 and ’ABT652 in the Normal-Function Mode D SCOPE ™ Instruction Set IEEE Standard 1149.1-1990 Required Instructions, Optional INTES
