SN74LVT18512 3.3-V ABT SCAN TEST DEVICES

Texas Instruments

Description

SN54LVT18512, SN54LVT182512, SN74LVT18512, SN74LVT182512 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SCBS711 * OCTOBER .
The ’LVT18512 and ’LVT182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE ™ testability integr.

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Datasheet Specifications

Part number: SN74LVT18512
Manufacturer: Texas Instruments ↗
File Size: 959.03 KB
Datasheet: SN74LVT18512-etcTI.pdf
Description: 3.3-V ABT SCAN TEST DEVICES

Applications

* of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE, Widebus, and UBT are trademarks of Texas Instruments Incorporated. UNLESS OTHERWISE NOTED this document contains PRODUCTION DATA information current as of publication date. Products con

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SN74LVT18512 3.3-V ABT SCAN TEST DEVICES Texas Instruments

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