Datasheet4U Logo Datasheet4U.com

ACS161MS - Radiation Hardened 4-Bit Synchronous Counter

Description

The Intersil ACS161MS is a Radiation Hardened 4-Bit Binary Synchronous Counter.

The MR is an active low master reset.

SPE is an active low Synchronous Parallel Enable which disables counting and allows data at the preset inputs (P0 - P3) to load the counter.

Features

  • Devices QML Qualified in Accordance with MIL-PRF-38535.
  • Detailed Electrical and Screening Requirements are Contained in SMD# 5962-96706 and Intersil’ QM Plan.
  • 1.25 Micron Radiation Hardened SOS CMOS.
  • Total Dose.
  • . . >300K RAD (Si).
  • Single Event Upset (SEU) Immunity: 100 P2 5 P3 6 PE.

📥 Download Datasheet

📁 Similar Datasheet

Part Number Description Manufacturer
ACS101A Acapella Optical Modem Semtech Corporation
ACS102-5T1 AC LINE SWITCH STMicroelectronics
ACS102-5TA AC LINE SWITCH STMicroelectronics
ACS102-6T Transient protected AC switch STMicroelectronics
ACS102A ACS102A Fiber Modem Semtech Corporation

Other Datasheets by Intersil (Renesas)

Part Number Description
ACS109MS Radiation Hardened Dual J-K Flip-Flop
ACS10MS Radiation Hardened Triple Three-Input NAND Gate
ACS112MS Radiation Hardened Dual J-K Flip-Flop
ACS11MS Radiation Hardened Triple 3-Input AND Gate
ACS125MS Radiation Hardened Quad Buffer

Full PDF Text Transcription (Reference)

The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.

View original datasheet text
ACS161MS January 1996 Radiation Hardened 4-Bit Synchronous Counter Pinouts 16 PIN CERAMIC DUAL-IN-LINE MIL-STD-1835, DESIGNATOR CDIP2-T16, LEAD FINISH C TOP VIEW MR 1 CP 2 P0 3 P1 4 16 VCC 15 TC 14 Q0 13 Q1 12 Q2 11 Q3 10 TE 9 SPE Features • Devices QML Qualified in Accordance with MIL-PRF-38535 • Detailed Electrical and Screening Requirements are Contained in SMD# 5962-96706 and Intersil’ QM Plan • 1.25 Micron Radiation Hardened SOS CMOS • Total Dose . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . >300K RAD (Si) • Single Event Upset (SEU) Immunity: <1 x 10 (Typ) -10 Errors/Bit/Day MEV-cm2/mg • SEU LET Threshold . . . . . . . . . . . . . . . . . . . . . . . >100 P2 5 P3 6 PE 7 GND 8 • Dose Rate Upset . . . . . . . . . . . . . . . .
Published: |