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HCTS646MS - Radiation Hardened Octal Bus Transceiver/Register

General Description

The Intersil HCTS646MS is a Radiation Hardened ThreeState Octal Bus Tranceiver/Register with Non-Inverting outputs.

This device is a bus transceiver with D-type flip-flops which act as internal storage registers.

Key Features

  • 3 Micron Radiation Hardened CMOS SOS Total Dose 200K RAD (Si) SEP Effective LET No Upsets: >100 MEV-cm2/mg Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/ Bit-Day (Typ) Dose Rate Survivability: >1 x 1012 RAD (Si)/s Dose Rate Upset >1010 RAD (Si)/s 20ns Pulse Cosmic Ray Upset Rate 2 x 10-9 Errors/Bit Day Latch-Up Free Under Any Conditions Fanout (Over Temperature.

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Part Number Description
HCTS00MS Radiation Hardened Quad 2-Input NAND Gate
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Full PDF Text Transcription (Reference)

The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.

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HCTS646MS August 1995 Radiation Hardened Octal Bus Transceiver/Register, Three-State Pinouts 24 LEAD CERAMIC DUAL-IN-LINE METAL SEAL PACKAGE (SBDIP) MIL-STD-1835 CDIP2-T24 TOP VIEW CAB 1 SAB 2 DIR 3 A0 4 A1 5 A2 6 A3 7 A4 8 A5 9 A6 10 A7 11 GND 12 24 VCC 23 CBA 22 SBA 21 OE 20 B0 19 B1 18 B2 17 B3 16 B4 15 B5 14 B6 13 B7 Features • • • • • • • • • • • • • 3 Micron Radiation Hardened CMOS SOS Total Dose 200K RAD (Si) SEP Effective LET No Upsets: >100 MEV-cm2/mg Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/ Bit-Day (Typ) Dose Rate Survivability: >1 x 1012 RAD (Si)/s Dose Rate Upset >1010 RAD (Si)/s 20ns Pulse Cosmic Ray Upset Rate 2 x 10-9 Errors/Bit Day Latch-Up Free Under Any Conditions Fanout (Over Temperature Range) - Bus Driver Outputs - 15 LSTTL Loads Military Temperature Rang