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ISL70023SEH - 60A Enhancement Mode GaN Power Transistor

General Description

3.

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Key Features

  • Very low rDS(ON) 5mΩ (typical).
  • Ultra low total gate charge 14nC (typical).
  • SEE hardness (see SEE report for details).
  • SEL/SEB LETTH (VDS = 100V, VGS = 0V): 86MeV.
  • cm2/mg(Si).
  • ISL70023SEH radiation accepting testing.
  • High dose rate (50-300rad(Si)/s): 100krad(Si).
  • Low dose rate (0.01rad(Si)/s): 75krad(Si).
  • ISL73023SEH radiation accepting testing.
  • Low dose rate (0.01rad(Si)/s): 75krad(Si).
  • Ultra small hermetically sealed 4 L.

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Other Datasheets by Intersil (now Renesas)

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Full PDF Text Transcription (Reference)

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ISL70023SEH, ISL73023SEH 100V, 60A Enhancement Mode GaN Power Transistor Datasheet The ISL70023SEH and ISL73023SEH are 100V N-channel enhancement mode GaN power transistors. These GaN FETs have been characterized for destructive Single Event Effects (SEE) and tested for Total Ionizing Dose (TID) radiation. Applications for these devices include commercial aerospace, medical, and nuclear power generation. The GaN’s exceptionally high electron mobility and low temperature coefficient allows for very low rDS(ON), while its lateral device structure and majority carrier diode provide exceptionally low QG and zero QRR. The end result is a device that can operate at a higher switching frequency with more efficiency while reducing the overall solution size.