Datasheet Summary
January 1996
Radiation Hardened Dual J-K Flip-Flop
Features
Pinouts
- Devices QML Qualified in Accordance with MIL-PRF-38535
- Detailed Electrical and Screening Requirements are Contained in SMD# 5962-96714 and Intersil’s QM Plan
- 1.25 Micron Radiation Hardened SOS CMOS
- Total Dose
- -
- -
- - . . >300K RAD (Si)
- Single Event Upset (SEU) Immunity: <1 x 10-10 Errors/Bit/Day
(Typ)
- SEU LET Threshold
- -
- - . . . >100 MEV-cm2/mg
- Dose Rate Upset
- -
- . >1011 RAD (Si)/s, 20ns Pulse
- Dose Rate Survivability
- - . >1012 RAD (Si)/s, 20ns Pulse
- Latch-Up...