EMC1815
EMC1815 is Multi-Channel Low-Voltage Remote Diode Sensor manufactured by Microchip Technology.
- Part of the EMC1812 comparator family.
- Part of the EMC1812 comparator family.
Features
- Measures Temperature Rate of Change Calculation with Preemptive Alert(s) Limits
- Up to Four External Temperature Monitors:
- 10-Lead Devices: ±1°C maximum accuracy (-20°C to +125°C TA, -40°C to +125°C TD)
- 8-Lead Devices: ±1°C maximum accuracy (-20°C to +105°C TA, -40°C to +125°C TD)
- Internal Temperature Sensor:
- ±1°C maximum accuracy, -40°C to +125°C
- Temperature Sensor Resolution (Internal/External): 0.125°C
- Configurable Alert Pins
- Operating Voltage: 1.62V to 3.6V
- Temperature Range: -40°C to +125°C
- Other Features
: Auto-Beta pensation, Configurable Ideality Factor, Hottest Diode pare, Resistance Error Correction
- Available in 8-Lead 2x2 mm WDFN, 10-Lead 2.5x2.0 mm VDFN and 10-Lead MSOP Packages
Typical Applications
- Temperature-Sensitive Storage
- Industrial
- Io T for Low System Voltage
- Portable Electronics
- Handheld Gaming
- puting
- Food Storage
© 2018-2022 Microchip Technology Inc. and its subsidiaries
Data Sheet
DS20005751F-page 1
EMC1812/13/14/15/33 Data Sheet
Description
The EMC1812/13/14/15/33 devices are high-accuracy, two-wire (I2C) temperature sensors. The devices monitor up to five temperature channels. Advanced features
, such as Resistance Error Correction (REC), Beta pensation (to support CPU diodes requiring the BJT/Transistor model) and rate of temperature change measurement bine to provide a robust solution for plex environmental monitoring applications.
This device family introduces Rate of Change (ROC) temperature measurement with associated alerts. This provides a preemptive system alert and another protective measurement layer to catch and manage variable system temperatures.
The Resistance Error Correction feature automatically eliminates the temperature error caused by series resistance, allowing for greater flexibility in routing thermal diodes. Beta pensation eliminates temperature errors caused by low, variable beta transistors mon in current fine geometry processors. The automatic beta detection...