SCANH16512SM Datasheet | National Semiconductor

Description The SCAN16512 is a high speed, low-power universal bus transceiver featuring data inputs organized into two 8-bit bytes with output enable and latch enable control signals. This function is configurable as a D-type Latch or Flip-Flop, and can operate in transparent, latched, or clocked mode. This device is pliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), Test Clock (TCK), and Test Reset (TRST). Features IEEE 1149.1 (JTAG) pliant 2.7V to 3.6V VCC Operation TRI-STATE outputs for bus-oriented applications Dual byte-wide data for bus applications Power down high Impedance inputs and outputs Optional Bus Hold on data inputs eliminates the need for external pullup/pulldown resistors (SCANH16512, SCANH162512 versions) n Optional 25Ω series resistors in outputs to minimize noise and eliminate termination resistors (SCAN162512, SCANH162512 versions) n Supports live insertion/withdrawal n Includes CLAMP and HIGHZ instructions n n n n n n Block Diagram © 2002 National Semiconductor Corporation DS200266 .national. SCAN16512 Pin Descriptions Pin Name A10-A17, A20-A27 B10-B17, B20-B27 CLKAB1, CLKBA1, CLKAB2, CLKBA2 GND VCC LEAB1, LEBA1, LEAB2, LEBA2 OEAB1, OEBA1, OEAB2, OEBA2 TDO TMS TCK TDI Normal-function A-bus I/O ports. See function table for normal-mode logic. Normal-function B-bus I/O ports. See function table for normal-mode logic. Normal-function clock inputs.See function table for normal-mode logic. Description Ground Supply Voltage Normal-function latch enables. See function table for normal-mode logic. Normal-function output enables. See function table for normal-mode logic. The Test Data Output to support IEEE Std 1149.1-1990. TDO is the serial output for shifting data through the instruction register or selected data register. The Test Mode...