Datasheet Summary
TND307 Graphical Data Test Circuits for the NCP1650
Prepared by Alan Ball ON Semiconductor Applications Engineering http://onsemi.
The following circuits are the test configurations that were used to obtain the data for the graphical section of the NCP1650/D data sheet. Each graph has a schematic associated with it and in some cases a description of the procedure.
14 V 1 mF 300 0 to
- 5 V Iavg Iavg fltr 10 11 1 nF 0- 5 V 0- 5 V 10 1k
APPLICATION NOTE
30 k
0.5 mF
0- 5 V 0.1 mF
..
47 k
Ramp GND CT p 15 k 15 14 13 10 k 470 pF 47 k
1 Vin 3 AC p 4 Ref Filter 5 AC Input 6 FB/SD 7 Loop p 8 Pp 9 Pmax
2 0.1 mF Vref NCP1650 16 Output 12 IS-
30 k
0.05 mF
Ramp...