Datasheet4U Logo Datasheet4U.com

TND307 Datasheet Graphical Data Test Circuits

Manufacturer: onsemi

Overview: TND307 Graphical Data Test Circuits for the NCP1650 Prepared by Alan Ball ON Semiconductor Applications Engineering http://onsemi. The following circuits are the test configurations that were used to obtain the data for the graphical section of the NCP1650/D data sheet.

General Description

of the procedure.

14 V 1 mF 300 0 to –5 V Iavg Iavg fltr 10 11 1 nF 0–5 V 0–5 V 10 1k APPLICATION NOTE 30 k 0.5 mF 0–5 V 0.1 mF ..

47 k Ramp GND CT p 15 k 15 14 13 10 k 470 pF 47 k 1 Vin 3 AC p 4 Ref Filter 5 AC Input 6 FB/SD 7 Loop p 8 Pp 9 Pmax 2 0.1 mF Vref NCP1650 16 Output 12 IS– 30 k 0.05 mF Ramp GND CT p 15 14 13 10 k 470 pF 47 k 1 Vin 3 AC p 4 Ref Filter 5 AC Input 6 FB/SD 7 Loop p 8 Pp 9 Pmax 2 0.1 mF Vref 16 Output 12 IS– Iavg Iavg fltr 10 11 14 V 1 mF Figure 1.

Key Features

  • Literature Distribution Center for ON Semiconductor P. O. Box 5163, Denver, Colorado 80217 USA Phone: 303.
  • 675.
  • 2175 or 800.
  • 344.
  • 3860 Toll Free USA/Canada Fax: 303.
  • 675.
  • 2176 or 800.
  • 344.

TND307 Distributor