• Part: FERD40U45C
  • Description: Field effect rectifier
  • Manufacturer: STMicroelectronics
  • Size: 119.77 KB
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STMicroelectronics
FERD40U45C
FERD40U45C is Field effect rectifier manufactured by STMicroelectronics.
Description This dual rectifier is based on a proprietary technology that achieves the best in class VF/IR for a given silicon surface. Packaged in TO-220AB, and D2PAK, this device is intended to be used in switch mode power supplies, or automotive applications A2 A1 D2PAK FERD40U45CG A1 K TO-220AB FERD40U45CT A2 Table 1. Device summary IF(AV) VRRM VF(typ) 2 x 20 A 45 V 0.31 V Features - ST advanced rectifier process - Stable leakage current over reverse voltage - Low forward voltage drop - High frequency operation November 2013 This is information on a product in full production. Doc ID024891 Rev 1 1/10 .st. Characteristics Characteristics Table 2. Absolute ratings (limiting values, per diode at 25° C, unless otherwise stated) Symbol VRRM IF(RMS) IF(AV) IFSM Tstg Tj 1. d Ptot --------------d Tj Parameter Repetitive peak reverse voltage Forward rms current Average forward current,  = 0.5 Surge non repetitive forward current Storage temperature range Maximum operating junction temperature (1) TO-220AB, D2PAK D2PAK (DC forward current without reverse bias, t = 1 hour) Value 45 40 Unit V A A A °C Tc =150° C Tc =145° C Per diode Per device 20 40 275 -65 to + 175 175 tp = 10 ms sinusoidal °C 200 - condition to avoid thermal runaway for a diode on its own heatsink  ------------------------Rth  j - a  Table 3. Thermal resistances Symbol Rth (j-c) Rth(c) Junction to case Coupling Parameter Per diode Total Value 1.6 1.1 0.5 Unit °C/W °C/W When the diodes 1 and 2 are used simultaneously: Tj(diode 1) = P(diode1) x Rth(j-c)(Per diode) + P(diode2) x Rth(c). Table 4. Static electrical characteristics (per diode) Symbol IR(1) Parameter Reverse leakage current Test Conditions Tj = 25° C Tj = 125° C Tj = 25° C VF(2) Forward voltage drop Tj = 125° C Tj = 25° C Tj = 125° C 1. Pulse test: tp = 5 ms,  < 2% 2. Pulse test: tp = 380 µs,  <...