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SCANPSC100F Datasheet Embedded Boundary Scan Controller

Manufacturer: Texas Instruments

Overview: OBSOLETE SCANPSC100F .ti. SNOS134D – SEPTEMBER 1998 – REVISED APRIL 2013 SCANPSC100F Embedded Boundary Scan Controller (IEEE 1149.

General Description

The SCANPSC100F is designed to interface a generic parallel processor bus to a serial scan test bus.

It is useful in improving scan throughput when applying serial vectors to system test circuitry and reduces the software overhead that is associated with applying serial patterns with a parallel processor.

The 'PSC100F operates by serializing data from the parallel bus for shifting through the chain of 1149.1 pliant ponents (i.e., scan chain).

Key Features

  • 1.
  • 23 Compatible with IEEE Std. 1149.1 (JTAG) Test Access Port and Boundary Scan Architecture.
  • Supported by Texas Instruments SCAN Ease (Embedded.

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