SN54LVTH182502A datasheet by Texas Instruments.
This datasheet includes multiple variants, all published together in a single manufacturer document.
| Part number | SN54LVTH182502A |
|---|---|
| Datasheet | SN54LVTH182502A SN54LVTH18502A Datasheet (PDF) |
| File Size | 829.79 KB |
| Manufacturer | Texas Instruments |
| Description | 3.3-V ABT SCAN TEST DEVICES |
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The ’LVTH18502A and ’LVTH182502A scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of plex circuit-board assemblies. Scan access to the test circuitry is acplished via the 4-wire test access port (TAP) interface.
View all Texas Instruments datasheets
| Part Number | Description |
|---|---|
| SN54LVTH182504A | 3.3-V ABT SCAN TEST DEVICES |
| SN54LVTH182512 | 3.3-V ABT SCAN TEST DEVICES |
| SN54LVTH182646A | 3.3-V ABT SCAN TEST DEVICES |
| SN54LVTH182652A | 3.3-V ABT SCAN TEST DEVICES |
| SN54LVTH18502A | 3.3-V ABT SCAN TEST DEVICES |
| SN54LVTH18504A | 3.3-V ABT SCAN TEST DEVICES |
| SN54LVTH18512 | 3.3-V ABT SCAN TEST DEVICES |
| SN54LVTH18646A | 3.3-V ABT SCAN TEST DEVICES |
| SN54LVTH18652A | 3.3-V ABT SCAN TEST DEVICES |
| SN54LVTH125 | 3.3-V ABT QUADRUPLE BUS BUFFER |
